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Abstract
摘要 |
Probing and modeling of carrier motions in thin films is a fundamental research subject in science and electronics. According to the Maxwell electromagnetic field theory, Maxwell’s displacement current flows due to change of electric flux density. In solids, thin films, monolayers, the electric flux density change is induced along with dynamical carrier motions. Consequently, by measuring Maxwell’s displacement current that flows across thin films, we can study dynamical carrier motions, including dipolar rotational motion, translational electron motion, and others. In my presentation, I will talk how MDC, TSC, and TOF measurements have been used for studying carrier dynamics in materials. Further as a n extension of probing electric flux density change by MDC, I will show that we can find a way to directly probe and visualize carrier motionsin thin filmsby directly probing dielectric polarization change induced by moving carriers and dipoles. The technique is an optical method based on electric field induced optical second harmonic generation (EFISHG) measurement, and it has been developed by the author.Finally I will stress that dielectric physics approach is one of key experimental ways to study carrier dynamics. |
