学术报告

Title
题目

Probing of Interfacial Carrier behavior and related phenomena in Organic devices by Electric Field Optical Second Harmonic Generation Measurement

Speaker
报告人

Prof. Mitsumasa Iwamoto

Home Institute

所在单位

Tokyo Institute of Technology

Date
日期

April 10,2014 16:00

Venue
地点

ITP New Building 6620,理论物理研究所新楼六层报告厅

Abstract
摘要

In this presentation, after briefly summarizing principle of EFISHG measurement, I will show that EFISHG is capable of detecting interfacial carrier behaviors and related phenomena in OLED and OSCs, and also show a novel experimental system that can detect local electric field in the film thickness direction, by using incident light paralell to the film thickness direction.

所内联系人

Contact Person

欧阳钟灿