Probing carrier motion in electrluminescence device by using optical second harmonic eneration is introduced and some its extended technique for probing carrier motion in double layer structure devices is discussed. First, an additional application  regading vizualization and description of electric field in the **organic**-**field** **effect** transistor is presented. Secondly, organic materials are recently applied on electronic devices as active layer for charge transport. Although prepared devices exhibit some properties of the inorganic semioconductor the charge transport process has a different origin. We showed that a time-resolved microscopic optical second-harmonic (TRM-SHG) technique is a powerful tool for electric field investigation in EL and OFET devices.